Materials Characterization lab provides advanced instrumentation for analyzing chemical, structural, electronic and mechanical properties of different materials and surfaces.
Equipped with scanning electronic microscopes, this facility is utilized by a variety of faculty across College of Science and Engineering (CSE) for different research projects and educational purposes. The primary ME courses this lab supports are: Mechanical Design (ME 384), Fluid Mechanics (ME 321), Micro-Electromechanical Systems (ME 337) and Senior Projects I and II (ME 391-392). Other areas of research and instruction include topics in Physics and Bioengineering.
- JEOL 6400V Scanning Electronic Microscopes (SEM) is instrumental for surface imaging and characterization studies. Includes an X-ray EDS system and an electronic image capture interface.
- TT-AFM Atomic Force Microscope is capable of imaging features in nm size. with a scanning range of 15 μm. An environmental cell measures in vivio living biological samples.